[IEEE 2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) - Shanghai, China (2015.11.20-2015.11.23)] 2015 IEEE International Conference on Applied Superconductivity and Electromagnetic Devices (ASEMD) - Numerical analysis on RHEED patterns based on gray level: A case study of IBAD-MgO film

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