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[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Education in the Global Economy
Abraham, Jacob, Mir, Salvador, Min, Yinghua, Wang, Jeremy, Wu, Cheng-WenYear:
2007
Language:
english
DOI:
10.1109/ats.2007.4387982
File:
PDF, 252 KB
english, 2007