[IEEE 16th Asian Test Symposium (ATS 2007) - Beijing, China (2007.10.8-2007.10.11)] 16th Asian Test Symposium (ATS 2007) - Test Point Selections for a Programmable Gain Amplifier Using NIST and Wavelet Transform Methods
Zhang, Xinsong, Ang, Simon S., Carter, ChandraYear:
2007
Language:
english
DOI:
10.1109/ats.2007.4388018
File:
PDF, 350 KB
english, 2007