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[IEEE 2015 IEEE AUTOTESTCON - National Harbor, MD, USA (2015.11.2-2015.11.5)] 2015 IEEE AUTOTESTCON - Supporting a product's life cycle utilizing reusable ATML compliant test documentation
Modi, Mukund, Stanco, Joe, Verbovsky, PatrickYear:
2015
Language:
english
DOI:
10.1109/autest.2015.7356469
File:
PDF, 958 KB
english, 2015