[IEEE 2013 71st Annual Device Research Conference (DRC) -...

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[IEEE 2013 71st Annual Device Research Conference (DRC) - Notre Dame, IN, USA (2013.06.23-2013.06.26)] 71st Device Research Conference - Characterization of low frequency noise in nanowire FETs considering variability and quantum effects

Lee, Sang-Hyun, Kim, Ye-Ram, Hong, Jae-Ho, Jeong, Eui-Young, Jang, Jun-Woo, Yoon, Jun-Sik, Kim, Dong-Won, Baek, Chang-Ki, Lee, Jeong-Soo, Jeong, Yoon-Ha
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Year:
2013
Language:
english
DOI:
10.1109/drc.2013.6633824
File:
PDF, 325 KB
english, 2013
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