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[IEEE International Electron Devices and Materials Symposium - Hsinchu, Taiwan (12-15 July, 1994)] International Electron Devices and Materials Symposium - Interface roughness effects on the properties of resonant tunneling hot electron transistor
Hanyu Sheng,, Soo-Jin Chua,Year:
1994
Language:
english
DOI:
10.1109/edms.1994.863775
File:
PDF, 287 KB
english, 1994