[IEEE 2014 IEEE International Conference on Electron Devices and Solid-State Circuits (EDSSC) - Chengdu, China (2014.6.18-2014.6.20)] 2014 IEEE International Conference on Electron Devices and Solid-State Circuits - Failure analysis of Gate-all-around Nanowire Field Effect Transistor under TLP test
Guoyan Zhang,, Aihua Dong,, Nie Liu,, Rui Tian,, Xuejiao Yang,, Zhiwei Liu,, Kohui Lee,, Horng-Chih Lin,, Liou, Juin J., Wang Yuxin,Year:
2014
Language:
english
DOI:
10.1109/edssc.2014.7061114
File:
PDF, 1.28 MB
english, 2014