[IEEE 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - Singapore (2015.12.2-2015.12.4)] 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - Packaging induced stress effects investigations on 40nm CMOS technology node: Measurements and optimization of device shifts
Ewuame, Komi Atchou, Bouchard, Pierre-Olivier, Fiori, Vincent, Gallois-Garreignot, Sebastien, Inal, Karim, Tavernier, ClementYear:
2015
Language:
english
DOI:
10.1109/eptc.2015.7412333
File:
PDF, 2.67 MB
english, 2015