[IEEE 2015 IEEE 17th Electronics Packaging and Technology...

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[IEEE 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - Singapore (2015.12.2-2015.12.4)] 2015 IEEE 17th Electronics Packaging and Technology Conference (EPTC) - Packaging induced stress effects investigations on 40nm CMOS technology node: Measurements and optimization of device shifts

Ewuame, Komi Atchou, Bouchard, Pierre-Olivier, Fiori, Vincent, Gallois-Garreignot, Sebastien, Inal, Karim, Tavernier, Clement
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Year:
2015
Language:
english
DOI:
10.1109/eptc.2015.7412333
File:
PDF, 2.67 MB
english, 2015
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