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[IEEE 2015 20th IEEE European Test Symposium (ETS) - Cluj-Napoca, Romania (2015.5.25-2015.5.29)] 2015 20th IEEE European Test Symposium (ETS) - Variability-aware aging modeling for reliability analysis of an analog neural measurement system
Heidmann, Nils, Hellwege, Nico, Paul, Steffen, Peters-Drolshagen, DagmarYear:
2015
Language:
english
DOI:
10.1109/ets.2015.7138753
File:
PDF, 690 KB
english, 2015