[IEEE 2010 3rd IEEE International Conference on Computer Science and Information Technology (ICCSIT 2010) - Chengdu, China (2010.07.9-2010.07.11)] 2010 3rd International Conference on Computer Science and Information Technology - A subthreshold surface potential modeling of drain/source edge effect in MOS transistors
Kalyan Koley,, Baishya, S.Year:
2010
Language:
english
DOI:
10.1109/iccsit.2010.5564725
File:
PDF, 1.47 MB
english, 2010