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[IEEE 2006 IEEE International Conference on IC Design and Technology - Padova, Italy (24-26 May 2006)] 2006 IEEE International Conference on IC Design and Technology - Silicon characterization of standby leakage reduction techniques in a 0.13μm Low Power Partially-Depleted Silicon-On-Insulator Technology
L'Hostis, N., Thomas, O., Haendler, S., Amara, A., Flatresse, P., Belleville, M.Year:
2006
Language:
english
DOI:
10.1109/icicdt.2006.1669366
File:
PDF, 4.90 MB
english, 2006