[IEEE 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Istanbul, Turkey (2003.05.16-2003.05.16)] 2003 IEEE International Symposium on Electromagnetic Compatibility, 2003. EMC '03. - Study on the failure mechanism of the electronic device in the transient electromagnetic field
Liu Di-Chen,, Zhang Li,, Li Chuan,, Chang Guanghui,, Wang Qing,, Zou Jiang-Feng,Year:
2003
Language:
english
DOI:
10.1109/icsmc2.2003.1429091
File:
PDF, 616 KB
english, 2003