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[IEEE 2015 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2015.12.7-2015.12.9)] 2015 IEEE International Electron Devices Meeting (IEDM) - Reliability variability simulation methodology for IC design: An EDA perspective
Zhang, Aixi, Huang, Chunyi, Guo, Tianlei, Chen, Alvin, Guo, Shaofeng, Wang, Runsheng, Huang, Ru, Xie, JushanYear:
2015
Language:
english
DOI:
10.1109/iedm.2015.7409677
File:
PDF, 1.26 MB
english, 2015