[IEEE 2014 IEEE 36th International Electronics Manufacturing Technology Conference (IEMT) - Johor, Malaysia (2014.11.11-2014.11.13)] 36th International Electronics Manufacturing Technology Conference - Maximizing electrical capabilities of test setup resources to enhance detection of setup problems (Test setup comprehensive- diagnostic)
Velasco, Jonathan A., Bullag, Rex, Atienza, JaniceYear:
2014
Language:
english
DOI:
10.1109/iemt.2014.7123110
File:
PDF, 2.29 MB
english, 2014