[IEEE 2015 Annual IEEE India Conference (INDICON) - New Delhi, India (2015.12.17-2015.12.20)] 2015 Annual IEEE India Conference (INDICON) - Power reduction techniques used in testing of VLSI circuits
Shaktisinh, Jadeja, Popat, Jayesh, Patel, RajendraYear:
2015
Language:
english
DOI:
10.1109/indicon.2015.7443367
File:
PDF, 335 KB
english, 2015