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[IEEE 2014 IEEE International Nanoelectronics Conference (INEC) - Sapporo, Japan (2014.7.28-2014.7.31)] 2014 IEEE International Nanoelectronics Conference (INEC) - Experimental study of charge trapping type FinFET flash memory
Liu, Yongxun, Nabatame, Toshihide, Matsukawa, Takashi, Endo, Kazuhiko, O'uchi, Sinichi, Tsukada, Junichi, Yamauchi, Hiromi, Ishikawa, Yuki, Mizubayashi, Wataru, Morita, Yukinori, Migita, Shinji, Ota,Year:
2014
Language:
english
DOI:
10.1109/inec.2014.7460429
File:
PDF, 1.43 MB
english, 2014