[IEEE 2014 IEEE International Nanoelectronics Conference...

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[IEEE 2014 IEEE International Nanoelectronics Conference (INEC) - Sapporo, Japan (2014.7.28-2014.7.31)] 2014 IEEE International Nanoelectronics Conference (INEC) - Characterization of body effect of Au-EGFET for KRAS gene detection

Hui-Hsin Chang,, Yi-Ting Lin,, Chai-Ming Yang,, Ji-dung Luo,, Chiuan-Chian Chiou,, Chao-Sung Lai,
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Year:
2014
Language:
english
DOI:
10.1109/inec.2014.7460457
File:
PDF, 1.41 MB
english, 2014
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