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[IEEE 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - Lisbon, Portugal (2015.5.24-2015.5.27)] 2015 IEEE International Symposium on Circuits and Systems (ISCAS) - On the reuse of existing error tolerance circuitry for low power scan testing
Anastasiou, Anthi, Tsiatouhas, Yiorgos, Arapoyanni, AngelaYear:
2015
Language:
english
DOI:
10.1109/iscas.2015.7168949
File:
PDF, 439 KB
english, 2015