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[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Use of wire-grid method to evaluate the effect of finite metallic plane of OATS on NSA in LF (30-100 MHz) region
Han-Chang Hsieh,, Ming-Iu Lai,, Wang, K.Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/isemc.2004.1349849
File:
PDF, 187 KB
english, 2004