[IEEE 2004 International Symposium on Electromagnetic...

  • Main
  • [IEEE 2004 International Symposium on...

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Use of wire-grid method to evaluate the effect of finite metallic plane of OATS on NSA in LF (30-100 MHz) region

Han-Chang Hsieh,, Ming-Iu Lai,, Wang, K.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
2
Year:
2004
Language:
english
DOI:
10.1109/isemc.2004.1349849
File:
PDF, 187 KB
english, 2004
Conversion to is in progress
Conversion to is failed