[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - The integrated error against log frequency (IELF) method for CEM validation
Simpson, R.J., Jones, C.R., MacDiarmid, I., Duffy, A., Coleby, D.Volume:
1
Year:
2005
Language:
english
DOI:
10.1109/isemc.2005.1513517
File:
PDF, 510 KB
english, 2005