[IEEE 2016 17th International Symposium on Quality...

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[IEEE 2016 17th International Symposium on Quality Electronic Design (ISQED) - Santa Clara, CA, USA (2016.3.15-2016.3.16)] 2016 17th International Symposium on Quality Electronic Design (ISQED) - Ruggedness evaluation and design improvement of automotive power MOSFETs

Ye, Tianhong, Chee, Kuan W. A.
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Year:
2016
Language:
english
DOI:
10.1109/isqed.2016.7479202
File:
PDF, 847 KB
english, 2016
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