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[IEEE 2006 International SiGe Technology and Device Meeting - Princeton, NJ, USA (15-17 May 2006)] 2006 International SiGe Technology and Device Meeting - A High Performance Photodetector in Standard SiGe BiCMOS Technology
Kuang-Sheng Lai,, Ji-Cheng Huang,, Hsu, K.Y.-J.Year:
2006
Language:
english
DOI:
10.1109/istdm.2006.1662603
File:
PDF, 1.39 MB
english, 2006