[IEEE 2001 IEEE Nuclear Science Symposium Conference Record - San Diego, CA, USA (4-10 Nov. 2001)] 2001 IEEE Nuclear Science Symposium Conference Record (Cat. No.01CH37310) - ASIC wafer test system for the ATLAS Semiconductor Tracker front-end chip
Anghinolfi, F., Bialas, W., Busek, N., Ciocio, A., Cosgrove, D., Fadeyev, V., Flacco, C., Gilchriese, M., Grillo, A.A., Haber, C., Kaplon, J., Lacasta, C., Murray, W., Niggli, H., Pritchard, T., RosenYear:
2002
Language:
english
DOI:
10.1109/nssmic.2001.1009645
File:
PDF, 253 KB
english, 2002