[IEEE 2015 IEEE UP Section Conference on Electrical Computer and Electronics (UPCON) - Allahabad, India (2015.12.4-2015.12.6)] 2015 IEEE UP Section Conference on Electrical Computer and Electronics (UPCON) - An improved and robust fusion framework for soft biometric traits
Sadhya, Debanjan, Singh, Sanjay KumarYear:
2015
Language:
english
DOI:
10.1109/upcon.2015.7456718
File:
PDF, 1.09 MB
english, 2015