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[IEEE 2015 International Workshop on CMOS Variability (VARI) - Salvador, Brazil (2015.9.1-2015.9.4)] 2015 International Workshop on CMOS Variability (VARI) - Is intrinsic noise a limiting factor for subthreshold digital logic in nanoscale CMOS?
Veirano, Francisco, Silveira, Fernando, Navinery, LiridaYear:
2015
Language:
english
DOI:
10.1109/vari.2015.7456562
File:
PDF, 812 KB
english, 2015