[IEEE 2003 IEEE 58th Vehicular Technology Conference. VTC 2003-Fall (IEEE Cat. No.03CH37484) - Orlando, FL, USA (2003.10.9-2003.10.9)] 2003 IEEE 58th Vehicular Technology Conference. VTC 2003-Fall (IEEE Cat. No.03CH37484) - Simplified life cycle assessment for eco-design
Jiyeon Ryu,, Ik Kim,, Eunsun Kwon,, Tak Hur,Year:
2003
Language:
english
DOI:
10.1109/vetecf.2003.239965
File:
PDF, 236 KB
english, 2003