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SPIE Proceedings [SPIE International Conference on Microelectronics - Warsaw, Poland (Monday 21 September 1992)] International Conference of Microelectronics: Microelectronics '92 - Capacitance measurements at low frequencies in the study of amorphous silicon
Pietruszko, Stanislaw M., Sokolowski, Marek, Sowinski, Andrzej, Grzybowski, Jan, Kucharski, Witold T., Romaniuk, Ryszard S.Volume:
1783
Year:
1992
Language:
english
DOI:
10.1117/12.131013
File:
PDF, 425 KB
english, 1992