SPIE Proceedings [SPIE International Conference on Microelectronics - Warsaw, Poland (Monday 21 September 1992)] International Conference of Microelectronics: Microelectronics '92 - Traps in neutron-transmutation-doped silicon introduced by proton irradiation
Nagl, Viliam, Hallen, Anders, Sowinski, Andrzej, Grzybowski, Jan, Kucharski, Witold T., Romaniuk, Ryszard S.Volume:
1783
Year:
1992
Language:
english
DOI:
10.1117/12.131056
File:
PDF, 404 KB
english, 1992