SPIE Proceedings [SPIE Applications in Optical Science and Engineering - Boston, MA (Sunday 15 November 1992)] Machine Vision Applications, Architectures, and Systems Integration - Automatic segmentation and classification of weld defects by x-ray inspection
Zhan, De-Chen, Chen, Jing-Chun, Batchelor, Bruce G., Solomon, Susan Snell, Waltz, Frederick M.Volume:
1823
Year:
1992
Language:
english
DOI:
10.1117/12.132082
File:
PDF, 677 KB
english, 1992