SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science and Technology - San Jose, CA (Sunday 31 January 1993)] Machine Vision Applications in Industrial Inspection - Modular system for automated surface inspection
Mills, Dennis C., Wu, Frederick Y., Dawson, Benjamin M.Volume:
1907
Year:
1993
DOI:
10.1117/12.144807
File:
PDF, 1.11 MB
1993