SPIE Proceedings [SPIE Optical Engineering and Photonics in Aerospace Sensing - Orlando, FL (Sunday 11 April 1993)] Systems-Oriented Optical Design - Control of residual chromatic aberration levels in infrared microscope objective designs
Alexay, Christopher C., Kampe, Thomas U., Oberheuser, Joseph H.Volume:
1970
Year:
1993
Language:
english
DOI:
10.1117/12.155834
File:
PDF, 500 KB
english, 1993