SPIE Proceedings [SPIE Laser-Induced Damage in Optical...

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SPIE Proceedings [SPIE Laser-Induced Damage in Optical Materials: 1993 - Boulder, CO (Wednesday 27 October 1993)] Laser-Induced Damage in Optical Materials: 1993 - 1.064-μm laser damage studies of silicon oxy-nitride narrow band reflectors

Milward, Jonathan R., Lewis, Keith L., Sheach, K., Heinecke, Rudolf A., Bennett, Harold E., Chase, Lloyd L., Guenther, Arthur H., Newnam, Brian E., Soileau, M. J.
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Volume:
2114
Year:
1994
Language:
english
DOI:
10.1117/12.180925
File:
PDF, 201 KB
english, 1994
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