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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] Applications of Digital Image Processing XVII - Spatial pattern classification for optical agricultural remote sensing
Wu, Chi-hsin, Doerschuk, Peter C., Tescher, Andrew G.Volume:
2298
Year:
1994
Language:
english
DOI:
10.1117/12.186567
File:
PDF, 589 KB
english, 1994