SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] X-Ray and Ultraviolet Spectroscopy and Polarimetry - Soft x-ray spectrometer for in situ monitoring of thin-film growth
Skytt, Per, Englund, Carl J., Wassdahl, Nial, Mancini, Derrick C., Nordgren, Joseph, Fineschi, SilvanoVolume:
2283
Year:
1994
Language:
english
DOI:
10.1117/12.193191
File:
PDF, 1.29 MB
english, 1994