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SPIE Proceedings [SPIE Photonics Asia - Beijing, China (Monday 5 November 2012)] Optical Metrology and Inspection for Industrial Applications II - A new 3D measurement method and its calibration based on the combination of binocular and monocular vision
Li, Dong, Tian, Jindong, Yang, Xin, Harding, Kevin G., Huang, Peisen S., Yoshizawa, ToruVolume:
8563
Year:
2012
Language:
english
DOI:
10.1117/12.2001255
File:
PDF, 467 KB
english, 2012