SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI - Exploring EUV near absorption edge optical constants for enhanced and sensitive grazing incidence reflectivity
Giday, S. Mewael, Zuppella, Paola, Pelizzo, M. G., Nicolosi, Piergiorgio, O'Dell, Stephen L., Pareschi, GiovanniVolume:
8861
Year:
2013
Language:
english
DOI:
10.1117/12.2027295
File:
PDF, 699 KB
english, 2013