SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 17 August 2014)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications II - Polarization measurement of free electron laser pulses in the VUV generated by the variable polarization source FERMI
Hau-Riege, Stefan P., Moeller, Stefan P., Yabashi, Makina, Finetti, P., Allaria, E., Diviacco, B., Callegari, C., Mahieu, B., Viefhaus, J., Zangrando, M., De Ninno, G., Lambert, G., Ferrari, E., Buck,Volume:
9210
Year:
2014
Language:
english
DOI:
10.1117/12.2062717
File:
PDF, 2.01 MB
english, 2014