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SPIE Proceedings [SPIE SPIE Commercial + Scientific Sensing and Imaging - Baltimore, Maryland, United States (Sunday 17 April 2016)] Dimensional Optical Metrology and Inspection for Practical Applications V - A guide to properly select the defocusing distance for accurate solution of transport of intensity equation while testing aspheric surfaces
Harding, Kevin G., Zhang, Song, Soltani, Peyman, Darudi, Ahmad, Moradi, Ali Reza, Amiri, Javad, Nehmetallah, GeorgeVolume:
9868
Year:
2016
Language:
english
DOI:
10.1117/12.2223208
File:
PDF, 783 KB
english, 2016