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SPIE Proceedings [SPIE Lasers, Optics, and Vision for Productivity in Manufacturing I - Besancon, France (Monday 10 June 1996)] Optical Inspection and Micromeasurements - Measuring the quality of fines by machine vision
Kemppainen-Kajola, Pia, Hirvonen, Juhani P., Laitinen, Jyrki, Luukko, Kari, Kansakoski, Markku, Gorecki, ChristopheVolume:
2782
Year:
1996
Language:
english
DOI:
10.1117/12.250790
File:
PDF, 658 KB
english, 1996