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SPIE Proceedings [SPIE Photonics China '96 - Beijing, China (Monday 4 November 1996)] Automated Optical Inspection for Industry - New concept for roughness measurement: mean surface
Wei, Chunlong, Chen, Mingyi, Wang, ZhiJiang, Wu, Frederick Y., Ye, ShenghuaVolume:
2899
Year:
1996
Language:
english
DOI:
10.1117/12.253025
File:
PDF, 266 KB
english, 1996