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SPIE Proceedings [SPIE Lasers and Optics in Manufacturing III - Munich, Germany (Monday 16 June 1997)] Sensors, Sensor Systems, and Sensor Data Processing - Telecentric scanner for 3D profilometry of very large objects
Thibault, Simon, Borra, Ermanno F., Szapiel, Stan, Loffeld, OtmarVolume:
3100
Year:
1997
Language:
english
DOI:
10.1117/12.287747
File:
PDF, 300 KB
english, 1997