![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Photonics East (ISAM, VVDC, IEMB) - Boston, MA (Sunday 1 November 1998)] Electro-Optic, Integrated Optic, and Electronic Technologies for Online Chemical Process Monitoring - Very fast imaging FT spectrometer for online process monitoring and control
Wadsworth, Winthrop, Dybwad, Jens-Peter, Fallahi, Mahmoud, Nordstrom, Robert J., Todd, Terry R.Volume:
3537
Year:
1999
Language:
english
DOI:
10.1117/12.341016
File:
PDF, 646 KB
english, 1999