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SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Yokohama, Japan (Wednesday 16 June 1999)] Optical Engineering for Sensing and Nanotechnology (ICOSN '99) - Sinusoidal wavelength-scanning interferometric reflectometry
Sasaki, Osami, Kuwahara, Tomokazu, Hara, Ryohta, Suzuki, Takamasa, Yamaguchi, IchirouVolume:
3740
Year:
1999
Language:
english
DOI:
10.1117/12.347759
File:
PDF, 320 KB
english, 1999