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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy X - Absolute calibration of the Chandra X-ray Observatory: transfer standard solid state detectors
Serej, Shokrollah R., Kellogg, Edwin M., Edgar, Richard J., Scholze, Frank, Ulm, Gerhard, Siegmund, Oswald H. W., Flanagan, Kathryn A.Volume:
3765
Year:
1999
Language:
english
DOI:
10.1117/12.366563
File:
PDF, 393 KB
english, 1999