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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Detectors for Crystallography and Diffraction Studies at Synchrotron Sources - Novel x-ray analysis methods using a MicroStrip gas chamber
Ochi, Atsuhiko, Tanimori, Toru, Nishi, Yuji, Nagayoshi, Tsutomu, Nishi, Yasuro, Ohashi, Yuji, Uekusa, Hidehiro, Toyokawa, Hidenori, Inoue, Katsuaki, Fujisawa, Tetsuro, Fraser, George W., Westbrook, EdVolume:
3774
Year:
1999
Language:
english
DOI:
10.1117/12.367125
File:
PDF, 646 KB
english, 1999