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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] EUV, X-Ray, and Neutron Optics and Sources - Testing of glancing incidence mirrors using sampled profile measurements

Church, Eugene L., Takacs, Peter Z., MacDonald, Carolyn A., Goldberg, Kenneth A., Maldonado, Juan R., Chen-Mayer, Huaiyu H., Vernon, Stephen P.
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Volume:
3767
Year:
1999
Language:
english
DOI:
10.1117/12.371108
File:
PDF, 564 KB
english, 1999
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