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SPIE Proceedings [SPIE Symposium on Integrated Optoelectronics - San Jose, CA (Thursday 20 January 2000)] Laser Diodes and LEDs in Industrial, Measurement, Imaging, and Sensors Applications II; Testing, Packaging, and Reliability of Semiconductor Lasers V - Al-free 950-nm BA diode lasers with high efficiency and reliability at 50° C ambient temperature
Erbert, Goetz, Beister, Gerhard, Knauer, Arne, Maege, Juergen, Pittroff, Wolfgang, Ressel, Peter, Sebastian, Juergen, Staske, R., Wenzel, Hans, Weyers, Marcus, Traenkle, Guenther, Burnham, Geoffrey T.Volume:
3945
Year:
2000
Language:
english
DOI:
10.1117/12.380547
File:
PDF, 269 KB
english, 2000