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SPIE Proceedings [SPIE AeroSense 2000 - Orlando, FL (Monday 24 April 2000)] Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XI - Performance comparison of rectangular (4-point) and diagonal (2-point) dither
Krapels, Keith A., Driggers, Ronald G., Vollmerhausen, Richard H., Halford, Carl E., Holst, Gerald C.Volume:
4030
Year:
2000
Language:
english
DOI:
10.1117/12.391776
File:
PDF, 2.22 MB
english, 2000