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SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Wednesday 13 September 2000)] 20th Annual BACUS Symposium on Photomask Technology - Using manufacturing rule check to prescreen reticle inspection databases
Howard, Charles H., DePesa, Paul, Linder, Curt J., Grenon, Brian J., Dao, Giang T.Volume:
4186
Year:
2001
Language:
english
DOI:
10.1117/12.410684
File:
PDF, 118 KB
english, 2001