![](/img/cover-not-exists.png)
SPIE Proceedings [SPIE Intelligent Systems and Smart Manufacturing - Boston, MA (Sunday 5 November 2000)] Machine Vision and Three-Dimensional Imaging Systems for Inspection and Metrology - License plate recognition using SKIPSM
Shridhar, Malayappan, Waltz, Frederick M., Miller, John W. V., Houle, G., Bijnagte, L., Dibble, Ryan A., Harding, Kevin G., Miller, John W. V., Batchelor, Bruce G.Volume:
4189
Year:
2001
Language:
english
DOI:
10.1117/12.417184
File:
PDF, 92 KB
english, 2001